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All publications
2010
2009
2008
2007
2006
2005
Design of Self-Testing Circuits Using Parity Codes (Paper in Electronic Proceedings (CD-ROM or web)) 2005, KUBALÍK P., KUBÁTOVÁ H. In Proceedings of Workshop 2005 [CD-ROM]. Prague: CTU, 2005, p. 214-215. ISBN 80-01-03201-9. (in Czech).
Reconfigurable Duplex System Increasing Fault Tolerance for Circuits Based on FPGAs (Paper in Conference Proceedings) 2005, KUBALÍK P., KUBÁTOVÁ H. In Proceedings of the Work in Progress Session. Linz: Johannes Kepler University, 2005, p. 13-14. ISBN 3-902457-09-0.
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Highly Reliable Design Based on TSC Circuits (Paper in Conference Proceedings) 2005, KUBALÍK P., KUBÁTOVÁ H. In Počítačové architektury & diagnostika. Prague: CTU, Faculty of Electrical Engineering, Department of Computer Science and Engineering, 2005, vol. 1, p. 101-106. ISBN 80-01-03298-1.
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Dependability Computations for Fault-Tolerant System Based on FPGA (Paper in Conference Proceedings) 2005, DOBIÁŠ R., KUBALÍK P., KUBÁTOVÁ H. In Proceedings of the 12th International Conferrence on Electronics, Circuits and Systems. Monterey: IEEE Circuits and Systems Society, 2005, vol. 1, p. 377-380. ISBN 9973-61-100-4.
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Fault Classification for Self-checking Circuits Implemented in FPGA (Paper in Conference Proceedings) 2005, KAFKA L., KUBALÍK P., KUBÁTOVÁ H., NOVÁK O. In Proceedings of IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop. Sopron: University of Western Hungary, 2005, p. 228-231. ISBN 963 9364 48 7.
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2004
2003
FPGA Implementation of USB 1.1 Device Core (Paper in Conference Proceedings) 2003, KUBALÍK P., BUČEK J. In Poster 2003. Prague: CTU, Faculty of Electrical Engineering, 2003, p. IC22.
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FPGA Implementation of USB 1.1 Device Core (Paper in Electronic Proceedings (CD-ROM or web)) 2003, KUBALÍK P., BUČEK J. In Proceedings of Workshop 2003 (online) [CD-ROM]. Prague: CTU, 2003, vol. A, p. 304-305. ISBN 80-01-02708-2.
Design of Self Checking Circuits Based on FPGA (Paper in Conference Proceedings) 2003, KUBALÍK P., KUBÁTOVÁ H. In Proceedings of the 15th International Conference on Microelectronics. Cairo: Cairo University, 2003, p. 378-381. ISBN 977-05-2010-1.
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