@INPROCEEDINGS{BelohoubekFiserSchmidt:2015:DSD,
author={Belohoubek, Jan and Fiser, Petr and Schmidt, Jan},
booktitle={Euromicro Conference on Digital System Design (DSD), 2015},
title={{Novel C-Element Based Error Detection and Correction Method Combining Time and Area Redundancy}},
year={2015},
pages={280-283},
keywords={Circuit faults;Delays;Integrated circuit modeling;Logic gates;Redundancy;Testing;Tunneling magnetoresistance;area-overhead;design for test;duplex system;error-correction;generalized C-element;offline-test;short duration offline test;stuck-at-fault;time-extended duplex scheme;time-overhead},
doi={10.1109/DSD.2015.95},
month={Aug},}